• Industry-leading portable 400G test solution, extending the RXT-6400 family capabilities
• Dual-port architecture supporting all major optical transceiver form factors, AOCs, and DACs
• Supports up to four concurrent and independent test sessions
• Native support for QSFP-DD, QSFP56, SFP-DD, and SFP56 PAM4 hardware (no adapters required)
• Future-ready FPGA-based architecture for emerging standards and applications
• Supports full range of 400GE interfaces including SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4, 400ZR/ZR+
• Intuitive GUI for fast setup, testing, and reporting for all user levels
• Advanced Layer 1–4 testing capabilities for validation, troubleshooting, and commissioning
• Designed for lab, field, and hyperscale data centre environments
• High-efficiency cooling system with dedicated QSFP-DD thermal management
• Portable handheld design optimised for mobility and field deployment
• Supports legacy interfaces alongside next-generation 400GE testing

• 2×400GE concurrent testing capability
• Dual-port support for all pluggable optics (AOC/DAC, fan-out, wrap-around tests)
• Supports 10M to 400GE testing range
• Up to four independent and simultaneous test sessions
• Full support for QSFP-DD, QSFP56, SFP-DD, SFP56, DACs, AOCs, and network equipment
• Complete Layer 2, Layer 3, and Layer 4 Ethernet test suite
• I2C/MDIO read and write access
• Per-lane PAM4 host pre-emphasis control
• Signal integrity testing with FEC codeword error distribution and skew analysis
• Transceiver monitoring (voltage, current, power consumption)
• Variable voltage supply support
• Internal and external QSFP-DD temperature monitoring with overheating protection
• Dedicated QSFP-DD cooling fans (field replaceable) for high-power modules (ZR/ZR+)
• High-capacity power system for long-reach coherent transceivers
• Battery backup for mobile field and data centre testing
• Intelligent high-efficiency cooling system
• Full portable handheld design

• Bring-into-service, verification, and troubleshooting of high-speed Ethernet links
• Optical transceiver validation and certification
• DAC and AOC testing with dual-port validation
• Fan-out testing and interoperability checks
• Lab evaluation, field deployment, and benchmarking
• Layer 1–4 network performance testing from 10M to 400GE
• Frame loss, throughput, and full-rate 400GE validation
• PCS & RS-FEC layer testing
• PAM4 signal integrity testing with multi-lane BERT
• I2C/MDIO verification and programming
• Maintenance and troubleshooting of legacy and modern networks
• Interoperability testing and field demonstrations

Test Interfaces 

• 2× QSFP-DD (PAM4)
• 2× QSFP56 / QSFP28 / QSFP+ (PAM4 / NRZ)
• 2× SFP-DD / SFP56 / SFP28 (PAM4 / NRZ)
• 2× SFP+ / SFP (NRZ)
• 2× RJ45
• 1× RJ48 and 3× SMA (legacy support)
• 2× Clock Inputs and 2× Clock Outputs
• Four independent test port groups

Additional Interface Notes: 

• Balanced ports available in RJ48 or Bantam connector
• Tx1, Rx1, and Rx2 supported (Rx2 may be used for monitoring applications)

PAM4 Interfaces 

• Native PAM4 support for QSFP-DD, QSFP56, SFP-DD, SFP56 transceivers
• Supports 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4, 400ZR/ZR+
• IEEE 802.3bs and MSA compliant transceivers
• 300W power supply supporting power classes 1–8
• Cage temperature monitoring with overheat protection
• External QSFP-DD cooling system support
• Per-lane pre- and post-emphasis control
• Lane BERT with independent test patterns

Optical Power Measurement 

• Global and per-lane transmit enable/disable
• Per-lane and composite optical power monitoring

Transmit Clock Sources 

• Internal 2.5 ppm VCXO with optional GPS 1PPS
• Recovered clock from incoming signal
• External reference: 1.544 MHz, 2.048 MHz, 10 MHz, BITS/SETS, 1PPS (50Ω SMA)

Line Frequency Testing 

• Line frequency offset generation: ±100 ppm (0.1 ppm steps)
• Frequency measurement in kHz
• Displays offset (min/max/current ppm across lanes)

Stress Test (Pre & Post FEC Suite) 

• One-button pass/fail validation
• User-defined thresholds
• Full reporting (settings + results)
• Frequency pulling range stress testing
• Pre-FEC and Post-FEC validation

Advanced Optical Transceiver Test Suite 

• Per-lane Pre-FEC BER validation under voltage/frequency stress
• Lane BERT for non-PAM4 interfaces
• Continuous monitoring of voltage, temperature, and BER
• Histogram-based correlation analysis
• Pre-FEC BER and optical power threshold-based pass/fail
• Pre-emphasis tuning (pre/post taps, attenuation control)
• Supply voltage sweep: 3.135V–3.465V
• Power consumption verification (W)
• Temperature monitoring with automatic shutdown protection
• Frequency tolerance sweep: -100 ppm to +100 ppm (0.1 ppm steps) 
• I2C baud rate sweep:
  • QSFP-DD/OSFP: 100K–4000K
  • QSFP28: 20K–1000K

Data Sheet – Download

User manual – Download